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A new intellectual property metric for standardization activities
作者: Tamura, S (Tamura, Suguru)
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来源出版物: TECHNOVATION
出版年: FEB-MAR 2016
摘要:
This study formulates a method to measure the effects of standardization to assist in evaluating innovation and R&D policies. Its main purpose is to examine standardization activities within R&D organizations. This allows for a more appropriate policy evaluation framework than examining such activities within standard development organizations does. The study also redefines the conventional notion of intellectual property (IP) normatively and introduces the term \"integrated IP\" to reflect our new concept of joining IP and standardization activities. Our new concept captures the \"fuzzy\" impact of standardization on R&D to improve innovation management. The study presents a vector equation expressing the new IP definition and uses it to model revenues arising from a standard-essential patent for strategic IP management with standardization. The model indicates the importance of patents commercially required for product differentiation for the purpose of innovation with standards. (C) 2016 Elsevier Ltd. All rights reserved.

入藏号: WOS:000372564300009

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